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A3P030-QNG48 +BOM

Field Programmable Gate Array with 768 CLBs, 30000 Gates, operating at 350MHz using CMOS technology

A3P030-QNG48 Allgemeine Beschreibung

The A3P030-QNG48 electronic component is a versatile and powerful device designed for various applications in electronics. With its numerous logic elements and gates, this microcontroller or programmable logic device can handle complex tasks with ease. The A3P030 series is known for its reliability and efficiency, making it a popular choice among engineers and designers

Hauptmerkmale

  • High Capacity
  • 15 k to 1 M System Gates
  • Up to 144 kbits of True Dual-Port SRAM
  • Up to 300 User I/Os
  • Reprogrammable Flash Technology
  • 130-nm, 7-Layer Metal (6 Copper), Flash-Based CMOS Process
  • Instant On Level 0 Support
  • Single-Chip Solution
  • Retains Programmed Design when Powered Off
  • High Performance
  • 350 MHz System Performance
  • 3.3 V, 66 MHz 64-Bit PCI†
  • In-System Programming (ISP) and Security
  • ISP Using On-Chip 128-Bit Advanced Encryption Standard (AES) Decryption (except ARM®-enabled ProASIC®3 devices) via JTAG (IEEE 1532–compliant)†
  • FlashLock® to Secure FPGA Contents
  • Low Power
  • Core Voltage for Low Power
  • Support for 1.5 V-Only Systems
  • Low-Impedance Flash Switches
  • High-Performance Routing Hierarchy
  • Segmented, Hierarchical Routing and Clock Structure
  • Advanced I/O
  • 700 Mbps DDR, LVDS-Capable I/Os (A3P250 and above)
  • 1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage Operation
  • Wide Range Power Supply Voltage Support per JESD8-B, Allowing I/Os to Operate from 2.7 V to 3.6 V
  • Bank-Selectable I/O Voltages—up to 4 Banks per Chip
  • Single-Ended I/O Standards: LVTTL, LVCMOS 3.3 V / 2.5 V / 1.8 V / 1.5 V, 3.3 V PCI / 3.3 V PCI-X† and LVCMOS 2.5 V / 5.0 V Input
  • Differential I/O Standards: LVPECL, LVDS, B-LVDS, and M-LVDS (A3P250 and above)
  • I/O Registers on Input, Output, and Enable Paths
  • Hot-Swappable and Cold Sparing I/Os‡
  • Programmable Output Slew Rate† and Drive Strength
  • Weak Pull-Up/-Down
  • IEEE 1149.1 (JTAG) Boundary Scan Test
  • Pin-Compatible Packages across the ProASIC3 Family
  • Clock Conditioning Circuit (CCC) and PLL†
  • Six CCC Blocks, One with an Integrated PLL
  • Configurable Phase-Shift, Multiply/Divide, Delay Capabilities and External Feedback
  • Wide Input Frequency Range (1.5 MHz to 350 MHz)
  • Embedded Memory†
  • 1 kbit of FlashROM User Nonvolatile Memory
  • SRAMs and FIFOs with Variable-Aspect-Ratio 4,608-Bit RAM Blocks (×1, ×2, ×4, ×9, and ×18 organizations)†
  • True Dual-Port SRAM (except ×18)
  • ARM Processor Support in ProASIC3 FPGAs
  • M1 ProASIC3 Devices—ARM®Cortex™-M1 Soft Processor Available with or without Debug

Spezifikationen

Part Life Cycle Code Active Reach Compliance Code compliant
ECCN Code EAR99 HTS Code 8542.31.00.01
Factory Lead Time 40 Weeks Clock Frequency-Max 350 MHz
JESD-30 Code S-XQCC-N48 Length 6 mm
Moisture Sensitivity Level 3 Number of CLBs 768
Number of Equivalent Gates 30000 Number of Terminals 48
Operating Temperature-Max 85 °C Operating Temperature-Min
Organization 768 CLBS, 30000 GATES Programmable Logic Type FIELD PROGRAMMABLE GATE ARRAY
Qualification Status Not Qualified Supply Voltage-Max 1.575 V
Supply Voltage-Min 1.425 V Supply Voltage-Nom 1.5 V
Surface Mount YES Technology CMOS
Temperature Grade COMMERCIAL Terminal Form NO LEAD
Terminal Pitch 0.4 mm Terminal Position QUAD
Width 6 mm

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