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MT29F8G08ABBCAH4:C +BOM

63-Pin VFBGA - Small form factor for space-constrained applications

MT29F8G08ABBCAH4:C Allgemeine Beschreibung

Micron Technology's MT29F8G08ABBCAH4:C is a game-changing NAND flash memory chip that offers unparalleled performance and reliability. With a capacity of 8 gigabits and high-speed data transfer rates, this chip is designed to meet the demands of data-intensive applications in various electronic devices such as smartphones, tablets, and solid-state drives. Operating at a voltage range of 2.7V to 3.6V, it is compatible with a wide range of systems, providing flexibility and versatility. Its multi-level cell (MLC) design strikes the perfect balance between cost and performance, making it a cost-effective and efficient storage solution. Additionally, the chip incorporates advanced error correction techniques to ensure data integrity and reliability, essential for seamless operation in today's digital landscape

Hauptmerkmale

  • Open NAND Flash Interface (ONFI) 1.0-compliant1
  • Single-level cell (SLC) technology
  • Organization
  • – Page size x8: 2112 bytes (2048 + 64 bytes)
  • – Page size x16: 1056 words (1024 + 32 words)
  • – Block size: 64 pages (128K + 4K bytes)
  • – Plane size: 2 planes x 2048 blocks per plane
  • – Device size: 4Gb: 4096 blocks; 8Gb: 8192 blocks 16Gb: 16,384 blocks
  • Asynchronous I/O performance
  • – tRC/tWC: 20ns (3.3V), 25ns (1.8V)
  • Array performance
  • – Read page: 25µs 3
  • – Program page: 200µs (TYP: 1.8V, 3.3V)3
  • – Erase block: 700µs (TYP)
  • Command set: ONFI NAND Flash Protocol
  • Advanced command set
  • – Program page cache mode4
  • – Read page cache mode 4
  • – One-time programmable (OTP) mode
  • – Two-plane commands 4
  • – Interleaved die (LUN) operations
  • – Read unique ID
  • – Block lock (1.8V only)
  • – Internal data move
  • Operation status byte provides software method for detecting
  • – Operation completion
  • – Pass/fail condition
  • – Write-protect status
  • Ready/Busy# (R/B#) signal provides a hardware method of detecting operation completion
  • WP# signal: Write protect entire device
  • First block (block address 00h) is valid when ship ped from factory with ECC. For minimum required ECC, see Error Management.
  • Block 0 requires 1-bit ECC if PROGRAM/ERASE cycles are less than 1000
  • RESET (FFh) required as first command after power-on
  • Alternate method of device initialization (Nand_In it) after power up (contact factory)
  • Internal data move operations supported within the plane from which data is read
  • Quality and reliability
  • – Data retention: 10 years
  • – Endurance: 100,000 PROGRAM/ERASE cycles
  • Operating voltage range
  • – VCC: 2.7–3.6V
  • – VCC: 1.7–1.95V
  • Operating temperature:
  • – Commercial: 0°C to +70°C
  • – Industrial (IT): –40ºC to +85ºC
  • Package
  • – 48-pin TSOP type 1, CPL2
  • – 63-ball VFBGA

Spezifikationen

Part Life Cycle Code Obsolete Reach Compliance Code compliant
ECCN Code EAR99 HTS Code 8542.32.00.51
Access Time-Max 30 ns Command User Interface YES
Data Polling NO JESD-30 Code R-PBGA-B63
Memory Density 8589934592 bit Memory IC Type FLASH
Memory Width 8 Number of Sectors/Size 4K
Number of Terminals 63 Number of Words 1073741824 words
Number of Words Code 1000000000 Operating Temperature-Max 70 °C
Operating Temperature-Min Organization 1GX8
Page Size 4K words Parallel/Serial PARALLEL
Programming Voltage 1.8 V Qualification Status Not Qualified
Ready/Busy YES Sector Size 256K
Standby Current-Max 0.00005 A Supply Current-Max 0.02 mA
Supply Voltage-Nom (Vsup) 1.8 V Surface Mount YES
Technology CMOS Temperature Grade COMMERCIAL
Terminal Form BALL Terminal Pitch 0.8 mm
Terminal Position BOTTOM Toggle Bit NO
Type SLC NAND TYPE

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