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Siehe Technische Spezifikationen

CLVTH16244AMDGGREP +BOM

Enhanced product 16-ch, 2.7-V to 3.6-V buffers with TTL-compatible CMOS inputs and 3-state outputs

Hersteller:

Texas Instruments, Inc
Herstellerteil #:

CLVTH16244AMDGGREP
Datenblatt:

CLVTH16244AMDGGREP Datenblatt (PDF)
Technology Family:

LVT
Supply Voltage (min) (V):

2.7
Supply Voltage (max) (V):

3.6
Number Of Channels:

16
EDA/CAD Modelle:

Fordern Sie kostenlose CAD-Modelle für an CLVTH16244AMDGGREP

CLVTH16244AMDGGREP Allgemeine Beschreibung

With built-in active bus-hold circuitry, the SN74LVTH16244A ensures that unused or undriven inputs are held at a valid logic state. It is important to note that the use of pullup or pulldown resistors with the bus-hold circuitry is not recommended, as it may affect the device's performance

Hauptmerkmale

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of up to -40°C to 85°C, -40°C to 125°C and -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree⁽¹⁾
Member of the Texas Instruments Widebus™ Family
State-of-the-Art Advanced BiCMOS Technology (ABT) Design for 3.3-V Operation and Low Static-Power Dissipation
Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V V_CC)
Supports Unregulated Battery Operation Down to 2.7 V
Typical V_OLP (Output Ground Bounce) <0.8 V at V_CC = 3.3 V, T_A = 25°C
I_off and Power-Up 3-State Support Hot Insertion
Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors
Latch-Up Performance Exceeds 500 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)

Widebus is a trademark of Texas Instruments

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Spezifikationen

Technology family	LVT	Supply voltage (min) (V)	2.7
Supply voltage (max) (V)	3.6	Number of channels	16
IOL (max) (mA)	24	Supply current (max) (µA)	5000
IOH (max) (mA)	-24	Input type	TTL-Compatible CMOS
Output type	3-State	Features	Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Power up 3-state, Ultra high speed (tpd <5ns)
Rating	HiRel Enhanced Product	Operating temperature range (°C)	-40 to 125, -40 to 85, -55 to 125
feature-logic-family	LVT	feature-logic-function	Buffer/Line Driver
feature-number-of-elements-per-chip	4	feature-number-of-inputs-per-chip	16
feature-number-of-outputs-per-chip	16	feature-polarity	Non-Inverting
feature-process-technology	BiCMOS	feature-output-type	3-State
feature-maximum-low-level-output-current-ma	24	feature-maximum-high-level-output-current-ma	-24
feature-minimum-operating-supply-voltage-v	2.7	feature-maximum-operating-supply-voltage-v	3.6
feature-tolerant-i-os-v	5	feature-packaging	Tape and Reel
feature-rad-hard	No	feature-pin-count	48
feature-cecc-qualified	No	feature-esd-protection
feature-escc-qualified		feature-military	No
feature-aec-qualified	No	feature-aec-qualified-number
feature-auto-motive	No	feature-p-pap	No
feature-eccn-code	EAR99	feature-svhc	Yes
feature-svhc-exceeds-threshold	No

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