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PC28F512P33TFA +BOM

Energy-efficient with only 31mA current consumption

PC28F512P33TFA Allgemeine Beschreibung

Designed for durability and reliability, the PC28F512P33TFA guarantees a minimum of 100,000 program/erase cycles, demonstrating its robust quality and long lifespan. In addition to its high capacity and fast speeds, this NAND Flash memory device offers advanced protection features, including hardware data protection and software-based security measures. These additional layers of security ensure that sensitive information stored on the device remains safe and secure at all times, making it a reliable choice for data storage in various embedded systems

Hauptmerkmale

  • High-Performance Read, Program and Erase
  • – 96 ns initial read access
  • – 108 MHz with zero wait-state synchronous burst reads: 7 ns clock-to-data output
  • – 133 MHz with zero wait-state synchronous burst reads: 5.5 ns clock-to-data output
  • – 8-, 16-, and continuous-word synchronous-burst Reads
  • – Programmable WAIT configuration
  • – Customer-configurable output driver impedance
  • – Buffered Programming: 2.0 μs/Word (typ), 512-Mbit 65 nm
  • – Block Erase: 0.9 s per block (typ)
  • – 20 μs (typ) program/erase suspend
  • Architecture
  • – 16-bit wide data bus
  • – Multi-Level Cell Technology
  • – Symmetrically-Blocked Array Architecture
  • – 256-Kbyte Erase Blocks
  • – 1-Gbit device: Eight 128-Mbit partitions
  • – 512-Mbit device: Eight 64-Mbit partitions
  • – 256-Mbit device: Eight 32-Mbit partitions
  • – 128-Mbit device: Eight 16-Mbit partitions
  • – Read-While-Program and Read-While-Erase
  • – Status Register for partition/device status
  • – Blank Check feature
  • Quality and Reliability
  • – Expanded temperature: –30 °C to +85 °C
  • – Minimum 100,000 erase cycles per block
  • – 65nm Process Technology
  • Power
  • – Core voltage: 1.7 V - 2.0 V
  • – I/O voltage: 1.7 V - 2.0 V
  • – Standby current: 60 μA (typ) for 512-Mbit, 65 nm
  • – Deep Power-Down mode: 2 μA (typ)
  • – Automatic Power Savings mode
  • – 16-word synchronous-burst read current: 23 mA (typ) @ 108 MHz; 24 mA (typ) @ 133 MHz
  • Software
  • – Micron® Flash data integrator (FDI) optimized
  • – Basic command set (BCS) and extended command set (ECS) compatible
  • – Common Flash interface (CFI) capable
  • Security
  • – One-time programmable (OTP) space
  • 64 unique factory device identifier bits
  • 2112 user-programmable OTP bits
  • – Absolute write protection: VPP = GND
  • – Power-transition erase/program lockout
  • – Individual zero latency block locking
  • – Individual block lock-down
  • Density and packaging
  • – 128Mb, 256Mb, 512Mbit, and 1-Gbit
  • – Address-data multiplexed and non-multiplexed interfaces
  • – 64-Ball Easy BGA

Spezifikationen

Programmabe Not Verified Memory Type Non-Volatile
Memory Format FLASH Technology FLASH - NOR
Memory Size 512Mbit Memory Organization 32M x 16
Memory Interface Parallel Clock Frequency 52 MHz
Write Cycle Time - Word, Page 95ns Access Time 95 ns
Voltage - Supply 2.3V ~ 3.6V Operating Temperature -40°C ~ 85°C (TA)
Mounting Type Surface Mount

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